Beamline overview
Version 5.1 by greving on 2022/02/12 14:18
Key parameters
Parameter | Value |
---|---|
Energy range | 5 - 50 keV monochromatic (DCM ΔE/E = 10-4, DMM ΔE/E = 10-2) |
Source | 2m Undulator, source size 36 x 6.1 µm2, divergence 28 x 4.0 µrad2 |
Monochromators | Double Crystal Monochmator Si[111], ΔE/E = 10-4, flux up to 2 x 1012 ph/s/mm2 |
Double Multilayer Monochromator Ru/C, W/B4C, ΔE/E = 10-2, flux up to 6 x 1012 ph/s/mm2 large beam profile (high divergence), homogeneous and stable | |
Techniques | Full field radiography, tomography with optional phase contrast |
FOV | EH1 - Nano tomography: TXM: up to 70 µm (140 µm), spatial resolution down to 50 nm NFH: from several µm up to mm sized samples, spatial resolution down to 100 nm EH2 - Micro tomography: up to 7 mm without extended FOV spatial resolution down to 1 µm |