Last modified by flenners on 2022/11/17 13:24
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flenners 4.1 3 \\
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5 == {{id name="X-rayNanotomography:in-situmeasurements-Nanoindenter"/}}Nanoindenter ==
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7 Micropillars (eg. milled using FIB or any etching techniques) – Compression of micropillars for stress-strain curves and determining yield strength, loading modulus, fracture strength (in case of brittle materials), compressive strength, etc.
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9 * Microcantilevers (eg. milled using FIB or any etching techniques) – Bend tests on microcantilevers for determining fracture toughness, critical energy release rate, study interfacial adhesion of thin films and multilayers, etc.
10 * Time dependent properties (in both indentation and micropillar compression): Creep, strain rate sensitivity and stress relaxation. Transient creep exponents, relaxation time constants, activation volumes and strain rate sensitivity exponents can be determined.
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12 * Low cycle fatigue tests in indentation, micropillar compression and microcantilever bending
13 * Scratch tests – nanoscale wear tests
14 * Sinus mode indents: For studying viscoelastic properties of polymers, studying change in mechanical properties of multilayers and functionally graded materials as a function of indentation depths
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16 * Repeated impact tests – delamination of delamination behaviour of films and coatings
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20 [[image:attach:image2022-11-17_10-55-55.png]]
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24 == {{id name="X-rayNanotomography:in-situmeasurements-Micropamipulator"/}}Micropamipulator ==
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28 [[image:attach:image2022-11-17_10-59-19.png]]
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32 **Different plug-in tools available**
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34 -Force measurement system
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36 -Microgripper
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38 -Micropipette
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40 -Micro soldering unit
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44 == {{id name="X-rayNanotomography:in-situmeasurements-Humidificationcell(usersetup)"/}}Humidification cell (user setup) ==